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Reliability

Micron’s SSDs incorporate advanced technology for defect and error management.

They use various combinations of hardware-based error correction algorithms and

firmware-based static and dynamic wear-leveling algorithms.

Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-

fined as data that is reported as successfully programmed to the SSD but when it is read

out of the SSD, the data differs from what was programmed.

Table 8: Uncorrectable Bit Error Rate

Uncorrectable Bit Error Rate Operation

1 sector per 10

bits read READ

Mean Time to Failure

The mean time to failure (MTTF) for the device was measured in a Reliability Demon-

stration Test at over 2 million hours.

Table 9: MTTF

Capacity MTTF (Operating Hours)

700GB

2.0 million

1.4TB

Endurance

Endurance for the device can be predicted based on the usage conditions applied to the

device, the internal NAND component PROGRAM/ERASE cycles, the write amplifica-

tion factor, and the wear-leveling efficiency of the drive. The table below shows the

drive lifetime for each SSD capacity based on predefined usage conditions. The SSD im-

plements wear leveling in hardware to optimize performance and efficiency while

maintaining Flash endurance.

Table 10: Drive Lifetime

Capacity Workload

Total Bytes Writ-

ten Drive Fills per Day Retention

700GB

4KB random writes 4.6PB 3.7 (5 years) 2 months

128KB sequential writes 9.7PB 7.6 (5 years) 2 months

1.4TB

4KB random writes 9.2PB 3.7 (5 years) 2 months

128KB sequential writes 19.5PB 7.6 (5 years) 2 months

Note:

1. Workloads are 100% writes.

P420m HHHL PCIe NAND SSD

Reliability

PDF: 09005aef853f2344

p420m_hhhl.pdf - Rev. O 8/2014 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

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