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SMART Attribute Summary
Table 3: SMART Command Reference
Attribute ID Hex ID Name SMART Trip Description
9 0x09 Power-on hours count No Lifetime powered-on hours, from the time the
device leaves the factory
12 0x0C Power cycle count No Count of power cycles
170 0xAA New failing block
count
No Grown defects
171 0xAB Program fail count No Number of NAND program status failures
172 0xAC Erase fail count No Number of NAND erase status failures
174 0xAE Unexpected power loss
count
No Number of unexpected power-loss occurrences
187 0xBB Reported uncorrecta-
ble errors count
No Number of ECC correction failures
188 0xBC Command timeout
count
No Number of command timeouts, defined by an
active command being interrupted by a HRESET,
COMRESET, SRST, or other command
194 0xC2 Temperature No The on-die temperature sensor within the con-
troller ASIC in degrees C, capturing the lifetime
high and low temperatures measured
202 0xCA Percentage of the rat-
ed lifetime used
No Cumulative erase count / lifetime erase count as
expressed as a percent. Lifetime erase count is
the total number of available blocks * block en-
durance for the flash technology, read directly
from the NAND device.
232 0xE8 Available reserved
space
No Percentage of spare blocks remaining
Spare block count
241 0xF1 Power-on (minutes) No Lifetime power-on time in minutes
242 0xF2 Write protect progress No Progress toward WRITE PROTECT mode: reports
100% when the drive becomes read only
247 0xF7 Cumulative host write
sector count
No Cumulative host program sector count divided
by 100,000
248 0xF8 Total NAND pages
written count
No Cumulative program page count divided by
100,000
Note:
1. Attribute/Hex IDs are noted for distribution product. Specific OEMs may have different
ID values, but the same list of SMART commands applies.
P420m HHHL PCIe NAND SSD
SMART Attribute Summary
PDF: 09005aef853f2344
p420m_hhhl.pdf - Rev. O 8/2014 EN
7
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2013 Micron Technology, Inc. All rights reserved.
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